In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures

Author
ADNANE, LHACENE
SILVA, HELENA
GOKIRMAK, ALI
LAM, C. H.
ZHU, YU
DIRISAGLIK, FARUK
Woods, Zachary
CYWAR, ADAM
ÇİL, Kadir
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URI
http://hdl.handle.net/20.500.12627/69977
http://www.mrs.org/fall-2015-program-kk/
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