In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures

dc.contributor.author	ADNANE, LHACENE
dc.contributor.author	SILVA, HELENA
dc.contributor.author	GOKIRMAK, ALI
dc.contributor.author	LAM, C. H.
dc.contributor.author	ZHU, YU
dc.contributor.author	DIRISAGLIK, FARUK
dc.contributor.author	Woods, Zachary
dc.contributor.author	CYWAR, ADAM
dc.contributor.author	ÇİL, Kadir
dc.date.accessioned	2021-03-04T08:41:58Z
dc.date.available	2021-03-04T08:41:58Z
dc.identifier.citation	ÇİL K., Woods Z., ADNANE L., CYWAR A., DIRISAGLIK F., ZHU Y., LAM C. H. , GOKIRMAK A., SILVA H., "In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures", Materials Research Society (MRS) 2015 Fall Meeting, Boston, Amerika Birleşik Devletleri, 29 Kasım - 04 Aralık 2015, cilt.KK, sa.321, ss.321
dc.identifier.other	vv_1032021
dc.identifier.other	av_648f29b9-f37f-4eac-8cbe-ee4842ca804e
dc.identifier.uri	http://hdl.handle.net/20.500.12627/69977
dc.identifier.uri	http://www.mrs.org/fall-2015-program-kk/
dc.language.iso	eng
dc.subject	Mühendislik, Bilişim ve Teknoloji (ENG)
dc.subject	Mühendislik ve Teknoloji
dc.subject	Mühendislik
dc.title	In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures
dc.type	Bildiri
dc.contributor.department	, ,
dc.identifier.volume	KK
dc.contributor.firstauthorID	390238

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