Detailed study on effects of gate voltage, frequency and temperature on dielectric properties of Cu/PAr/n-CdS/SnO2 MIS Schottky diode

Author
Çalışkan, Murat
Serin, Merih
Yıldırım, Saffettin
Kuruoğlu, Furkan
Metadata
Show full item record
URI
http://hdl.handle.net/20.500.12627/1702
https://doi.org/10.1088/1361-6463/abd80e
Collections