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dc.contributor.authorTakagi, Shigetaga
dc.contributor.authorYarman, B. Siddik
dc.contributor.authorFujii, Nobuo
dc.contributor.authorRetdian, Nicodimus
dc.date.accessioned2021-03-04T09:52:43Z
dc.date.available2021-03-04T09:52:43Z
dc.identifier.citationYarman B. S. , Retdian N., Takagi S., Fujii N., "Gain-bandwidth properties of 0.18 mu m Si-CMOS transistor up to 10 GHz", International Symposium on Signals, Circuits and Systems, Iasi, Romanya, 12 - 13 Temmuz 2007, ss.65-66
dc.identifier.othervv_1032021
dc.identifier.otherav_6a61f6fa-048c-4240-be39-1f63c8b0a818
dc.identifier.urihttp://hdl.handle.net/20.500.12627/73624
dc.description.abstractIn this paper, gain bandwidth limitations of a regularly processed 0.18 mu m Si CMOS FET is investigated over the frequency band of 450MHz-10GHz. It is exhibited that 0.18 mu m Si CMOS processing technology can safely be utilized to manufacture Ultra Wideband RF-Amplifiers for commercial wireless communication systems placed on a single chip up to X-Band.
dc.language.isoeng
dc.subjectBilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği
dc.subjectSinyal İşleme
dc.subjectBilgisayar Bilimleri
dc.subjectVeritabanı ve Veri Yapıları
dc.subjectMühendislik ve Teknoloji
dc.subjectMÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK
dc.subjectMühendislik
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectBilgisayar Bilimi
dc.subjectBİLGİSAYAR BİLİMİ, YAZILIM MÜHENDİSLİĞİ
dc.titleGain-bandwidth properties of 0.18 mu m Si-CMOS transistor up to 10 GHz
dc.typeBildiri
dc.contributor.departmentTokyo Institute of Technology , ,
dc.contributor.firstauthorID133426


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