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dc.contributor.authorCarroll, B. R.
dc.contributor.authorCelebi, Yaşar Gürkan
dc.contributor.authorCox, S. F. J.
dc.contributor.authorKing, P. J. C.
dc.contributor.authorBani-Salameh, H. N.
dc.contributor.authorMeyer, A. G.
dc.contributor.authorVernon, J. E.
dc.contributor.authorLichti, R. L.
dc.date.accessioned2021-03-03T21:06:46Z
dc.date.available2021-03-03T21:06:46Z
dc.identifier.citationCelebi Y. G. , Lichti R. L. , Bani-Salameh H. N. , Meyer A. G. , Carroll B. R. , Vernon J. E. , King P. J. C. , Cox S. F. J. , "Muonium transitions in 4H silicon carbide", Physica B: Condensed Matter, cilt.404, ss.845-848, 2009
dc.identifier.issn0921-4526
dc.identifier.othervv_1032021
dc.identifier.otherav_5d815528-e509-4480-915b-d86f2d2fd293
dc.identifier.urihttp://hdl.handle.net/20.500.12627/65449
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=62949144470&origin=inward
dc.identifier.urihttps://doi.org/10.1016/j.physb.2008.11.155
dc.description.abstractPreliminary low-field data on the diamagnetic muon spin rotation signal in 4H-SiC are presented. The initial results on all three electrical types of 4H-SiC are compared with those for the 6H polytype. Analysis of amplitude transitions at low temperatures in n- and p-type samples indicates carrier capture. At temperatures above 600 K, an increase in diamagnetic amplitude and an associated dip in the phase indicate a slowly formed state in the p-type material. We discuss possible identification of transitions evident from temperature dependent diamagnetic amplitudes and correlations with neutral muonium centers. (c) 2008 Elsevier B.V. All rights reserved.
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectTemel Bilimler (SCI)
dc.subjectFizik
dc.subjectFİZİK, YOĞUN MADDE
dc.subjectYoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler
dc.titleMuonium transitions in 4H silicon carbide
dc.typeMakale
dc.relation.journalPhysica B: Condensed Matter
dc.contributor.departmentTexas Tech University System , ,
dc.identifier.volume404
dc.identifier.startpage845
dc.identifier.endpage848
dc.contributor.firstauthorID192150


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