Dielectric polarization in Sb2Te3 thin films

Abstract

Dielectric properties of Sb2Te3 films prepared by thermal evaporation technique onto clean glass substrates using ohmic aluminum electrodes have been investigated in the frequency range of 0.01-100 kHz and within the temperature range of 293K-373 K. Both the dielectric constant epsilon(1) and dielectric loss factor were found to depend on frequency and temperature. The activation values were evaluated and good agreement between the activation energy values obtained from capacitance and dielectric loss factor measurements were obtained.