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dc.contributor.authorUlutas, K.
dc.contributor.authorYakut, Şahin
dc.contributor.authorDeger, Deniz
dc.date.accessioned2021-03-03T11:42:22Z
dc.date.available2021-03-03T11:42:22Z
dc.identifier.citationUlutas K., Yakut Ş., Deger D., "Dielectric polarization in Sb2Te3 thin films", 11th Europhysical Conference on Defects in Insulating Materials (EURODIM), Pecs, Macaristan, 12 - 16 Temmuz 2010, cilt.15
dc.identifier.othervv_1032021
dc.identifier.otherav_297692db-1477-4629-aa57-91c899779bc6
dc.identifier.urihttp://hdl.handle.net/20.500.12627/32708
dc.identifier.urihttps://doi.org/10.1088/1757-899x/15/1/012038
dc.description.abstractDielectric properties of Sb2Te3 films prepared by thermal evaporation technique onto clean glass substrates using ohmic aluminum electrodes have been investigated in the frequency range of 0.01-100 kHz and within the temperature range of 293K-373 K. Both the dielectric constant epsilon(1) and dielectric loss factor were found to depend on frequency and temperature. The activation values were evaluated and good agreement between the activation energy values obtained from capacitance and dielectric loss factor measurements were obtained.
dc.language.isoeng
dc.subjectMühendislik ve Teknoloji
dc.subjectMALZEME BİLİMİ, MULTIDISCIPLINARY
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMalzeme Bilimi
dc.titleDielectric polarization in Sb2Te3 thin films
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.identifier.volume15
dc.contributor.firstauthorID136558


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