Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett

dc.contributor.author	Geller, M.
dc.contributor.author	ÖNCAN, Nurten
dc.contributor.author	Marent, A.
dc.contributor.author	Bimberg, D.
dc.contributor.author	AKÇAY, Namık
dc.contributor.author	Nowozin, T.
dc.date.accessioned	2021-03-04T15:05:19Z
dc.date.available	2021-03-04T15:05:19Z
dc.identifier.citation	Nowozin T., Marent A., Geller M., Bimberg D., AKÇAY N., ÖNCAN N., "Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett", APPLIED PHYSICS LETTERS, cilt.94, 2009
dc.identifier.issn	0003-6951
dc.identifier.other	vv_1032021
dc.identifier.other	av_84e95c79-c690-4cac-abd0-688868f917d5
dc.identifier.uri	http://hdl.handle.net/20.500.12627/90390
dc.language.iso	eng
dc.subject	Temel Bilimler
dc.subject	Fizik
dc.subject	Temel Bilimler (SCI)
dc.title	Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure, Appl. Phys. Lett
dc.type	Makale
dc.relation.journal	APPLIED PHYSICS LETTERS
dc.contributor.department	, ,
dc.identifier.volume	94
dc.contributor.firstauthorID	278266

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