Electrical Resistivity of Liquid Ge2Sb2Te5 Based on Thin Film and Nanoscale Device Measurement

dc.contributor.author	SILVA, HELENA
dc.contributor.author	ZHU, YU
dc.contributor.author	LAM, CHUNG
dc.contributor.author	GOKIRMAK, ALI
dc.contributor.author	ÇİL, Kadir
dc.contributor.author	DIRISAGLIK, FARUK
dc.contributor.author	ADNANE, LHACENE
dc.contributor.author	WENNBERG, MAREN
dc.contributor.author	KING, ADRIENNE
dc.contributor.author	FARACLAS, AZER
dc.contributor.author	AKBULUT, MUSTAFA B.
dc.date.accessioned	2021-03-04T10:49:20Z
dc.date.available	2021-03-04T10:49:20Z
dc.identifier.citation	ÇİL K., DIRISAGLIK F., ADNANE L., WENNBERG M., KING A., FARACLAS A., AKBULUT M. B. , ZHU Y., LAM C., GOKIRMAK A., et al., "Electrical Resistivity of Liquid Ge2Sb2Te5 Based on Thin Film and Nanoscale Device Measurement", Materials Research Society (MRS) 2013 Spring Meeting, San Francisco, Amerika Birleşik Devletleri, 1 - 05 Nisan 2013, cilt.EE, sa.303, ss.303
dc.identifier.other	vv_1032021
dc.identifier.other	av_6f1d56b7-abd3-4e03-8a7b-a345c50a4c41
dc.identifier.uri	http://hdl.handle.net/20.500.12627/76691
dc.identifier.uri	http://www.mrs.org/s13-program-ee/
dc.language.iso	eng
dc.subject	Mühendislik
dc.subject	Mühendislik ve Teknoloji
dc.subject	Mühendislik, Bilişim ve Teknoloji (ENG)
dc.title	Electrical Resistivity of Liquid Ge2Sb2Te5 Based on Thin Film and Nanoscale Device Measurement
dc.type	Bildiri
dc.contributor.department	Eskişehir Osmangazi Üniversitesi , ,
dc.identifier.volume	EE
dc.contributor.firstauthorID	390062

Files in this item

Files	Size	Format	View
There are no files associated with this item.