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Thickness dependence of dielectric loss in anodic Al2O3 thin films

dc.contributor.authorUlutaş, Hulusı Kemal
dc.contributor.authorDeğer, Denız
dc.date.accessioned2021-03-02T20:19:11Z
dc.date.available2021-03-02T20:19:11Z
dc.identifier.citationUlutaş H. K. , Değer D., "Thickness dependence of dielectric loss in anodic Al2O3 thin films", 28th International Physics Congress, Muğla, Türkiye, 1 - 04 Eylül 2011, ss.635
dc.identifier.otherav_0159cc4d-7302-47b6-999a-c78b224ec5a6
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/6894
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler (SCI)
dc.titleThickness dependence of dielectric loss in anodic Al2O3 thin films
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732579


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