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dc.contributor.authorLudwig, S.
dc.contributor.authorKendirlik, E. M.
dc.contributor.authorWegscheider, W.
dc.contributor.authorSirt, S.
dc.contributor.authorKalkan, S. B.
dc.contributor.authorSiddiki, A.
dc.contributor.authorDietsche, W.
dc.date.accessioned2021-03-03T18:37:55Z
dc.date.available2021-03-03T18:37:55Z
dc.identifier.citationKendirlik E. M. , Sirt S., Kalkan S. B. , Dietsche W., Wegscheider W., Ludwig S., Siddiki A., "Anomalous resistance overshoot in the integer quantum Hall effect", SCIENTIFIC REPORTS, cilt.3, 2013
dc.identifier.issn2045-2322
dc.identifier.othervv_1032021
dc.identifier.otherav_501f9c2b-6633-462f-a5ee-0670916cfbec
dc.identifier.urihttp://hdl.handle.net/20.500.12627/57073
dc.identifier.urihttps://doi.org/10.1038/srep03133
dc.description.abstractIn this work we report on experiments performed on smooth edge-narrow Hall bars. The magneto-transport properties of intermediate mobility two-dimensional electron systems are investigated and analyzed within the screening theory of the integer quantized Hall effect. We observe a non-monotonic increase of Hall resistance at the low magnetic field ends of the quantized plateaus, known as the overshoot effect. Unexpectedly, for Hall bars that are defined by shallow chemical etching the overshoot effect becomes more pronounced at elevated temperatures. We observe the overshoot effect at odd and even integer plateaus, which favor a spin independent explanation, in contrast to discussion in the literature. In a second set of the experiments, we investigate the overshoot effect in gate defined Hall bar and explicitly show that the amplitude of the overshoot effect can be directly controlled by gate voltages. We offer a comprehensive explanation based on scattering between evanescent incompressible channels.
dc.language.isoeng
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler
dc.subjectTemel Bilimler (SCI)
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.titleAnomalous resistance overshoot in the integer quantum Hall effect
dc.typeMakale
dc.relation.journalSCIENTIFIC REPORTS
dc.contributor.departmentİstanbul Üniversitesi , ,
dc.identifier.volume3
dc.contributor.firstauthorID211611


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