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Thickness Dependence of Dielectric Properties in Plasma poly ethylene oxide (pPEO) Thin Films

dc.contributor.authorDeğer, Deniz
dc.contributor.authorYakut, Şahin
dc.contributor.authorUlutaş, Hulusi Kemal
dc.date.accessioned2021-03-03T16:07:26Z
dc.date.available2021-03-03T16:07:26Z
dc.identifier.citationUlutaş H. K. , Değer D., Yakut Ş., "Thickness Dependence of Dielectric Properties in Plasma poly ethylene oxide (pPEO) Thin Films", Turkish Physical Society 31th International Physics Congress, Muğla, Türkiye, 21 - 24 Temmuz 2014, ss.113
dc.identifier.otherav_42936d08-e81f-48ba-90bc-06bb333ca1c5
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/48470
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler (SCI)
dc.titleThickness Dependence of Dielectric Properties in Plasma poly ethylene oxide (pPEO) Thin Films
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732361


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