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The thickness dependence of dielectric properties of amorphous Al2O3 films

dc.contributor.authorDeğer, Denız
dc.contributor.authorUlutaş, Hulusı Kemal
dc.date.accessioned2021-03-03T15:10:40Z
dc.date.available2021-03-03T15:10:40Z
dc.identifier.citationDeğer D., Ulutaş H. K. , "The thickness dependence of dielectric properties of amorphous Al2O3 films", International Conference of Atomic Collision Solids, Paris, Fransa, 1 - 04 Ağustos 2001, ss.150
dc.identifier.othervv_1032021
dc.identifier.otherav_3da465cf-a95f-402b-bbec-0a90ae4b49f1
dc.identifier.urihttp://hdl.handle.net/20.500.12627/45305
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler (SCI)
dc.titleThe thickness dependence of dielectric properties of amorphous Al2O3 films
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732698


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