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Comparison of dielectric dispersion of Al2O3 and Se thin films

dc.contributor.authorUlutaş, K.
dc.contributor.authorDEGER, Davut
dc.date.accessioned2021-03-03T11:53:29Z
dc.date.available2021-03-03T11:53:29Z
dc.date.issued2001
dc.identifier.citationDEGER D., Ulutaş K., "Comparison of dielectric dispersion of Al2O3 and Se thin films", Journal of Applied Physics, cilt.89, sa.12, ss.8101-8104, 2001
dc.identifier.issn0021-8979
dc.identifier.othervv_1032021
dc.identifier.otherav_2a9eae43-3ae2-42fc-bc90-1e357b4c4977
dc.identifier.urihttp://hdl.handle.net/20.500.12627/33427
dc.identifier.urihttps://doi.org/10.1063/1.1372161
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0035875282&origin=inward
dc.language.isoeng
dc.titleComparison of dielectric dispersion of Al2O3 and Se thin films
dc.typeMakale
dc.relation.journalJournal of Applied Physics
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.identifier.volume89
dc.identifier.issue12
dc.identifier.startpage8101
dc.identifier.endpage8104
dc.contributor.firstauthorID107885


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