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dc.contributor.authorTatar, Beyhan
dc.contributor.authorÜrgen, Mustafa Kamil
dc.contributor.authorDemiroglu, D.
dc.date.accessioned2022-02-18T11:03:25Z
dc.date.available2022-02-18T11:03:25Z
dc.identifier.citationTatar B., Demiroglu D., Ürgen M. K. , "Investigation of structural and electrical properties of p-CuPc/c-Si and p-CuPc/a-Si/c-Si hybrid photodiodes prepared by CSP technique", MICROELECTRONIC ENGINEERING, cilt.126, ss.184-190, 2014
dc.identifier.issn0167-9317
dc.identifier.othervv_1032021
dc.identifier.otherav_d2613e4f-13da-4a4f-b75a-ac5fdcb78b6e
dc.identifier.urihttp://hdl.handle.net/20.500.12627/180408
dc.identifier.urihttps://doi.org/10.1016/j.mee.2014.07.017
dc.description.abstractTo produce p-CuPc/c-Si and p-CuPc/a-Si/c-Si heterojunctions, at first, amorphous silicon thin film was deposited on p-Si (111) and n-Si (100) single crystalline substrates by high vacuum electron beam evaporation technique. Subsequently p-type organic semiconductor CuPc thin film was prepared on different substrates, which are Si single crystalline wafer, amorphous silicon and corning glass substrates by chemical spray pyrolysis (CSP) technique. The structural properties of CuPc thin films were investigated by XRD and Raman analysis. The CuPc thin film grown on corning glass and c-Si wafer substrate have orthorhombic alpha-phase crystalline nature and show only one characteristic peak oriented in (200) direction. The CuPc thin film grown on a-Si substrate has an amorphous structure. Surface and cross-sectional morphology of CuPc/c-Si and CuPc/a-Si/c-Si heterojunctions were investigated by FESEM images. The electrical transport and diode parameters of these organic-inorganic hybrid heterojunction have been investigated by means of dc current-voltage (I-V) measurements at room temperature in dark condition. The current-voltage characteristics of these hybrid heterojunctions demonstrated good rectifying behavior and have good photosensitivity in light conditions. The diode parameters such as barrier height Phi(B), diode ideality factor n, series resistance R-s and shunt resistance R-sh were determined from the I-V characteristic. The values of the ideality factor (n) and zero-bias barrier height (Phi(B0)) of CuPc/c-Si and CuPc/a-Si hybrid heterojunctions were found to be 9.64-8.06 and 0.93-0.89 eV respectively. It is revealed that the dominant conducting mechanism type of these organic-inorganic heterojunction diodes which have space charge limited conduction mechanism (SCLC). The values of the quantum efficiency (QE) of CuPc/c-Si and CuPc/a-Si hybrid heterojunctions were found to be 19.6-41% respectively. We have fabricated CuPc/a-Si/c-Si organic-inorganic hybrid photodiode with 41% quantum efficiency which corresponds to a responsivity of 0.21 A/W at 632.8 nm wavelength. These hybrid heterojunctions based on organic CuPc and inorganic c-Si can be used in photodiode due to photosensitivity and electrical properties. (C) 2014 Elsevier B.V. All rights reserved.
dc.language.isoeng
dc.subjectFİZİK, UYGULAMALI
dc.subjectBilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği
dc.subjectSinyal İşleme
dc.subjectElektromanyetizma, Akustik, Isı Transferi, Klasik Mekanik ve Akışkanlar Dinamiği
dc.subjectOptik
dc.subjectYoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler
dc.subjectYüzeyler ve arayüzeyler; İnce filmler ve nanosistemler
dc.subjectTemel Bilimler
dc.subjectMühendislik ve Teknoloji
dc.subjectSignal Processing
dc.subjectGeneral Engineering
dc.subjectStatistical and Nonlinear Physics
dc.subjectEngineering (miscellaneous)
dc.subjectElectrical and Electronic Engineering
dc.subjectTemel Bilimler (SCI)
dc.subjectPhysical Sciences
dc.subjectOPTİK
dc.subjectFizik
dc.subjectNANOBİLİM VE NANOTEKNOLOJİ
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMühendislik
dc.subjectMÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK
dc.titleInvestigation of structural and electrical properties of p-CuPc/c-Si and p-CuPc/a-Si/c-Si hybrid photodiodes prepared by CSP technique
dc.typeMakale
dc.relation.journalMICROELECTRONIC ENGINEERING
dc.contributor.departmentTekirdağ Namık Kemal Üniversitesi , ,
dc.identifier.volume126
dc.identifier.startpage184
dc.identifier.endpage190
dc.contributor.firstauthorID3051012


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