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dc.contributor.authorDeğer, Denız
dc.contributor.authorYakut, Şahin
dc.contributor.authorUlutaş, Hulusı Kemal
dc.date.accessioned2021-03-06T19:51:28Z
dc.date.available2021-03-06T19:51:28Z
dc.identifier.citationUlutaş H. K. , Değer D., Yakut Ş., "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films", 15 th International conference on thin films, Kyoto, Japonya, 1 - 04 Kasım 2011, ss.206
dc.identifier.otherav_f84990e3-e19a-4d17-8d06-baaf9c2d38ad
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/162652
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler (SCI)
dc.titleThickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732584


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