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dc.contributor.authorPrice, Berat Yuksel
dc.contributor.authorHardal, Gokhan
dc.date.accessioned2021-03-06T11:55:16Z
dc.date.available2021-03-06T11:55:16Z
dc.identifier.citationHardal G., Price B. Y. , "Aging Behaviour in Ni0.5Cox Mn-2.5_O-x(4) (x=0.5, 0.8 and 1.1) Thermistors", TMS Annual Meeting and Exhibition / Symposium on Characterization of Minerals, Metals, and Materials, California, Amerika Birleşik Devletleri, 01 Ocak 2017, ss.85-89
dc.identifier.othervv_1032021
dc.identifier.otherav_f1646afd-5e37-4020-bb3f-0aff1e0a27f0
dc.identifier.urihttp://hdl.handle.net/20.500.12627/158364
dc.identifier.urihttps://doi.org/10.1007/978-3-319-51382-9_10
dc.description.abstractNegative temperature coefficient (NTC) thermistors are required to have good electrical stability for many domestic and industrial applications. The aging phenomenon of NTC thermistors can be described as the change in electrical resistance due to thermal stress with time. In this study, Ni0.5Co Mn-2.5_O-x(4) (x = 0.5, 0.8 and 1.1) ceramics were fabricated by the conventional solid-state reaction method. The powder mixtures of manganese, cobalt and nickel oxides were ball-milled for 5 h. The powders were calcinated at 900 degrees C for 2 h. The samples were sintered at 1100 degrees C for 5 h. To investigate the aging behaviour, the samples were held at 150 degrees C for 400 h. Aging in the samples were calculated by the following equation; AR/R0 = (R - R-0)/R-0 in which Ro is the resistance at 25 degrees C before the aging test, and R is the resistance at 25 degrees C after the aging test.
dc.language.isoeng
dc.subjectYoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler
dc.subjectYüzeyler ve arayüzeyler; İnce filmler ve nanosistemler
dc.subjectTemel Bilimler
dc.subjectMühendislik ve Teknoloji
dc.subjectMalzeme Bilimi
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMALZEME BİLİMİ, MULTIDISCIPLINARY
dc.subjectTemel Bilimler (SCI)
dc.subjectFizik
dc.subjectNANOBİLİM VE NANOTEKNOLOJİ
dc.titleAging Behaviour in Ni0.5Cox Mn-2.5_O-x(4) (x=0.5, 0.8 and 1.1) Thermistors
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , ,
dc.contributor.firstauthorID150508


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