| dc.contributor.author | Kuntman, AYTEN | |
| dc.contributor.author | Kacar, FIRAT | |
| dc.contributor.author | Kuntman, Hakan | |
| dc.date.accessioned | 2021-03-06T09:14:55Z | |
| dc.date.available | 2021-03-06T09:14:55Z | |
| dc.identifier.citation | Kacar F., Kuntman A., Kuntman H., "A simple approach for modeling the influence of hot-carrier effect on threshold voltage of MOS transistors", 13th International Conference on Microelectronics (ICM 2001), Rabat, Malta, 29 - 31 Ekim 2001, ss.43-46 | |
| dc.identifier.other | vv_1032021 | |
| dc.identifier.other | av_e4c20200-1266-4b04-b372-b45653ba8495 | |
| dc.identifier.uri | http://hdl.handle.net/20.500.12627/150525 | |
| dc.identifier.uri | https://doi.org/10.1109/icm.2001.997482 | |
| dc.description.abstract | Hot-carrier-induced degradation of MOSFET parameters over time is an important reliability concept in modern microcircuits. In this paper, a new simple expression based on polynomial aproximation is proposed for modeling the influence of hot-carrier effect on the MOSFET threshold voltage. The method is especially useful to determine the degradation of the MOS transistors in analogue building blocks and to predict the operation reliability therefore it provides ne possibilities in the analogue IC design. | |
| dc.language.iso | eng | |
| dc.subject | Bilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği | |
| dc.subject | Sinyal İşleme | |
| dc.subject | Bilgisayar Bilimleri | |
| dc.subject | Donanım | |
| dc.subject | Veritabanı ve Veri Yapıları | |
| dc.subject | Mühendislik ve Teknoloji | |
| dc.subject | MÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK | |
| dc.subject | Mühendislik | |
| dc.subject | BİLGİSAYAR BİLİMİ, YAZILIM MÜHENDİSLİĞİ | |
| dc.subject | Mühendislik, Bilişim ve Teknoloji (ENG) | |
| dc.subject | Bilgisayar Bilimi | |
| dc.subject | BİLGİSAYAR BİLİMİ, DONANIM VE MİMARLIK | |
| dc.title | A simple approach for modeling the influence of hot-carrier effect on threshold voltage of MOS transistors | |
| dc.type | Bildiri | |
| dc.contributor.department | İstanbul Üniversitesi , , | |
| dc.contributor.firstauthorID | 17272 | |
