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Temperature Dependent Electrical Characterization and Crystallization of Nanocrystalline Silicon

dc.contributor.authorCARPENA, EMMANUEL
dc.contributor.authorÇİL, Kadir
dc.contributor.authorSILVA, HELENA
dc.contributor.authorGOKIRMAK, ALI
dc.contributor.authorWILLIAMS, N.
dc.date.accessioned2021-03-05T20:56:30Z
dc.date.available2021-03-05T20:56:30Z
dc.identifier.citationWILLIAMS N., CARPENA E., ÇİL K., SILVA H., GOKIRMAK A., "Temperature Dependent Electrical Characterization and Crystallization of Nanocrystalline Silicon", Materials Research Society (MRS) 2010 Spring Meeting, San Francisco, Amerika Birleşik Devletleri, 5 - 09 Nisan 2010, cilt.A, no.179, ss.179
dc.identifier.othervv_1032021
dc.identifier.otherav_d689a434-0360-410e-9a2e-9735df298870
dc.identifier.urihttp://hdl.handle.net/20.500.12627/141572
dc.identifier.urihttp://www.mrs.org/s10-abstract-a/
dc.language.isoeng
dc.subjectMühendislik
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMühendislik ve Teknoloji
dc.titleTemperature Dependent Electrical Characterization and Crystallization of Nanocrystalline Silicon
dc.typeBildiri
dc.contributor.departmentAbd , ,
dc.identifier.volumeA
dc.contributor.firstauthorID390201


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