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Wafer test probe burn modeling

dc.contributor.authorTunaboylu, Bahadır
dc.contributor.authorZAFER, BAHA
dc.date.accessioned2021-03-05T18:50:34Z
dc.date.available2021-03-05T18:50:34Z
dc.identifier.citationZAFER B., Tunaboylu B., "Wafer test probe burn modeling", NanoTrVIII, Ankara, Türkiye, 1 - 04 Haziran 2012, ss.48-55
dc.identifier.otherav_cc4e2ce9-15d5-4448-a16d-541df8f31ffd
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/135272
dc.language.isotur
dc.subjectMühendislik ve Teknoloji
dc.subjectMühendislik
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.titleWafer test probe burn modeling
dc.typeBildiri
dc.contributor.departmentİstanbul Şehir Üniversitesi , ,
dc.contributor.firstauthorID596038


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