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dc.contributor.authorULUTAŞ, HULUSI KEMAL
dc.contributor.authorULUTAŞ, DENIZ
dc.date.accessioned2021-03-05T07:48:27Z
dc.date.available2021-03-05T07:48:27Z
dc.identifier.citationULUTAŞ H. K. , ULUTAŞ D., "Thickness dependence of optical properties of amorphous Indium Oxide Thin Films deposited by reactive evaporation", 21st General Conference of Condensed Matter Division, Almanya, 1 - 04 Mart 2006, ss.171
dc.identifier.otherav_95a7e5d9-b607-4e15-9f92-ab1c7bcd6730
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/100771
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectTemel Bilimler (SCI)
dc.titleThickness dependence of optical properties of amorphous Indium Oxide Thin Films deposited by reactive evaporation
dc.typeBildiri
dc.contributor.department, ,
dc.contributor.firstauthorID398636


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