Transcatheter Closure of Perimembranous Ventricular Septal Defects using Nit-Occlud((R)) L VSD Coil: Early and Mid-Term Results

Abstract

Our objective was to investigate the short- and mid-term results of transcatheter ventricular septal defect (VSD) closure with the Nit-Occlud(A (R)) L VSD coil. Retrospective data collection study. Data were collected from 20 patients who underwent transcatheter VSD closure with the Nit-Occlud(A (R)) L VSD coil device between October 2011 and June 2013. The mean age of the study subjects was 7.3 +/- A 4.0 years, and the mean weight was 25.7 +/- A 11.8 kg. The distance between the defect and the aortic valve, measured using angiography, was an average of 5.1 +/- A 2.0 mm, and the left ventricular opening averaged 8.2 +/- A 2.1 mm. The mean value of the Q (p)/Q (s) ratio was 1.7 +/- A 0.4. Intravascular hemolysis developed in the first few hours after the procedure in three patients. In one of these cases, despite medical treatment and the implantation of a detachable coil placed into the Nit-Occlud(A (R)) device transcatheterly, hemolysis persisted. This device was removed and the VSD was closed surgically. In the other two cases, although the residual shunt persisted on echocardiography, the hemolysis regressed spontaneously. There were no rhythm problems or other complications during the follow-up period of 12.3 +/- A 6.6 months. In the selected cases, for the transcatheter treatment of VSD, the Nit-Occlud(A (R)) L VSD coil device can be used. When compared with other VSD closure devices, there was no development of a permanent atrioventricular block, which is an important advantage. However, patients with a residual shunt should be monitored closely for the development of hemolysis during the first few hours.